SAN FRANCISCO — During the Semicon West trade show, Agilent, Credence and Electroglas separately rolled out automatic test equipment (ATE) solutions to attack chip-testing costs. Electroglas Inc.
PLEASANTON, Calif. — In what could finally lower chip-testing costs, Inovys Corp. here entered the automatic test equipment (ATE) business, announcing its initial and long-awaited tester for system-on ...
From wafer to system level test, parallel test execution delivers significant benefits, including reduced costs, yet it’s never as simple as that PowerPoint slide you present to management. An ...
Keysight Technologies, Inc. (NYSE: KEYS) announced a new series of high-power ATE system power supplies, expanding its power ...
The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...
This is the last article in a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on ATE performance requirements. The first article, which ...
New portfolio of compact, regenerative power supplies and loads helps engineers address complexity, space, and sustainability demands in modern test environments SANTA ROSA, Calif.--(BUSINESS WIRE)-- ...
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