Semiconductor testing plays a crucial role in the supply chain, with industry players prioritizing factors such as test speed, cost, signal measurement accuracy, one-stop test capabilities, and ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
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