This application note describes methods for testing components using an oscilloscope and waveform generator. We will show you how to test capacitors, inductors, diodes, bi-polar transistors, output ...

In the modern age, when you hear “component tester” you probably think of one of those cheap microcontroller-based devices that can identify components and provide basic measurements on an LCD screen.

The modern oscilloscope is no longer just a time-domain measurement tool, as test equipment vendors integrate logic, protocol, and spectrum analysis functions. (Image courtesy of Thinkstock). As ...

EE-Evaluation Engineering began in March 1962 as a vehicle for reliability topics, primarily as they related to passive components. IC failure analysis was featured in a 1968 article, and that year ...