University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision measurement at the nanometer scale in scenarios where background noise and ...

The circuit was aimed to measure the variation in magnetic and electric fields by designing an electromagnetic probe with a headphone socket and an output meter. Electromagnetic Field (EMF) – a ...

New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Rigol Technologies, Inc. introduces the RP1000 Series of oscilloscope probes, the latest addition to its line of passive and active differential probes. Rigol Technologies, Inc. introduces the RP1000 ...