Statistical Process Control (SPC) provides the means for the control of product quality and the reduction of process variation. To be successful you need to know how to collect data, understand the ...

This article is focused on introducing a control chart technique using relative standard deviation (RSD) statistics (i.e., RSD chart); in other words, a coefficient of variation chart for continued ...

The author outlines key considerations for carrying out a structured approach to monitoring process performance and ensuring product quality. Routine, ongoing assessment of process performance and ...

As technology nodes shrink to 90 nanometers and below, chips become much more difficult to manufacture. In-die process variations increase substantially at 90 nm — even more at 65 nm. If these effects ...